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Monday, May 13th, 2013 at 09:00:00 AM


Thursday, May 16th, 2013 at 06:00:00 PM  

ICM Munich, Germany

Published on-line at 10:54:08 AM on Wednesday, December 12th, 2012

SPIE Optical Metrology 2013

The European conference on optical metrology will be held in Munich in May 2013.

SPIE Optical Metrology 2013 is the premier European conference bringing together scientists, engineers, researchers, and applications and product developers engaged in all aspects of optical metrology.

Important dates are 17 December 2012 (abstract due date), 11 February 2013 (author notification), 11 March 2013 (onsite manuscripts due), 18 April 2013 (post-meeting manuscripts due).

Main topics

Optical Measurement Systems for Industrial Inspection (Conference EOM101) - Chair(s): Peter H. Lehmann

Modeling Aspects in Optical Metrology (Conference EOM102) - Chair(s): Bernd Bodermann

Optics for Arts, Architecture, and Archaeology (Conference EOM103) - Chair(s): Luca Pezzati; Piotr Targowski

Videometrics, Range Imaging and Applications (Conference EOM104) - Chair(s): Fabio Remondino; Mark R. Shortis

Optical Methods for Inspection, Characterization and Imaging of Biomaterials (Conference EOM105) - Chair(s): Pietro Ferraro; Monika Ritsch-Marte

Automated Visual Inspection (Conference EOM106) - Chair(s): Jürgen Beyerer; Fernando Puente León